Thin film depth profiling by ion beam analysis. (2016)
Attributed to:
University of Surrey Ion Beam Centre
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1039/c6an01167e
PubMed Identifier: 27747322
Publication URI: http://europepmc.org/abstract/MED/27747322
Type: Journal Article/Review
Volume: 141
Parent Publication: The Analyst
Issue: 21
ISSN: 0003-2654