Thin film depth profiling by ion beam analysis. (2016)

First Author: Jeynes C

Attributed to: University of Surrey Ion Beam Centre funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1039/c6an01167e

PubMed Identifier: 27747322

Publication URI: http://europepmc.org/abstract/MED/27747322

Type: Journal Article/Review

Volume: 141

Parent Publication: The Analyst

Issue: 21

ISSN: 0003-2654