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A specimen-tracking controller for the transverse dynamic force microscope in non-contact mode (2016)

First Author: Hatano T

Attributed to: Robustness and adaptivity: advanced control and estimation algorithms for the transverse dynamic atomic force microscope funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/acc.2016.7526838

Publication URI: http://dx.doi.org/10.1109/acc.2016.7526838

Type: Conference/Paper/Proceeding/Abstract