Drain current multiplication in thin pillar vertical MOSFETs due to depletion isolation and charge coupling (2016)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/s10825-016-0853-y

Publication URI: http://dx.doi.org/10.1007/s10825-016-0853-y

Type: Journal Article/Review

Parent Publication: Journal of Computational Electronics

Issue: 3