Effects of annealing conditions on resistive switching characteristics of SnOx thin films (2016)
Attributed to:
ZnO MESFETs for application to Intelligent Windows
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.jallcom.2016.02.215
Publication URI: http://dx.doi.org/10.1016/j.jallcom.2016.02.215
Type: Journal Article/Review
Parent Publication: Journal of Alloys and Compounds