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Micromilled silica REfractometer with Nanoscale Surface Roughness (2015)

First Author: Carpenter L G

Attributed to: Quantum Integrated Nonlinear Technologies for Enabling Stable, Scaleable, Engineered Commercial Exploitation (QuINTESSEnCE) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: https://www.osapublishing.org/abstract.cfm?uri=CLEO_Europe-2015-CE_10_4

Type: Conference/Paper/Proceeding/Abstract