Micromilled silica REfractometer with Nanoscale Surface Roughness (2015)
Attributed to:
Quantum Integrated Nonlinear Technologies for Enabling Stable, Scaleable, Engineered Commercial Exploitation (QuINTESSEnCE)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Publication URI: https://www.osapublishing.org/abstract.cfm?uri=CLEO_Europe-2015-CE_10_4
Type: Conference/Paper/Proceeding/Abstract