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Susceptible workload driven selective fault tolerance using a probabilistic fault model (2016)

First Author: Gutierrez M

Attributed to: Resilient and Testable Energy-Efficient Digital Hardware funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/iolts.2016.7604682

Publication URI: http://dx.doi.org/10.1109/iolts.2016.7604682

Type: Conference/Paper/Proceeding/Abstract