Real-time and on-site ?-ray radiation response testing system for semiconductor devices and its applications (2016)

First Author: Mu Y
Attributed to:  High permittivity dielectrics on Ge for end of Roadmap application funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.nimb.2016.01.035

Publication URI: http://dx.doi.org/10.1016/j.nimb.2016.01.035

Type: Journal Article/Review

Parent Publication: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms