Radiation response analyzer of semiconductor dies (2013)

First Author: Mu Yifei
Attributed to:  High permittivity dielectrics on Ge for end of Roadmap application funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ipfa.2013.6599252

Publication URI: http://dx.doi.org/10.1109/ipfa.2013.6599252

Type: Conference/Paper/Proceeding/Abstract

ISBN: 978-1-4799-1241-4