Towards 3D-Electrical Capacitance Tomography for Interface Detection Thresholding method improves accuracy for real-world 3D process monitoring (2016)
Attributed to:
Embedding Manufacturing Development into Formulation Research (EMFormR)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1595/205651316x691537
Publication URI: http://dx.doi.org/10.1595/205651316x691537
Type: Journal Article/Review
Parent Publication: Johnson Matthey Technology Review
Issue: 2