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X-ray spectromicroscopy investigation of soft and hard breakdown in RRAM devices. (2016)

First Author: Carta D

Attributed to: Reliably unreliable nanotechnologies funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/0957-4484/27/34/345705

PubMed Identifier: 27420908

Publication URI: http://europepmc.org/abstract/MED/27420908

Type: Journal Article/Review

Volume: 27

Parent Publication: Nanotechnology

Issue: 34

ISSN: 0957-4484