On the origin of resistive switching volatility in Ni/TiO2/Ni stacks (2016)
Attributed to:
Reliably unreliable nanotechnologies
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.4960690
Publication URI: http://dx.doi.org/10.1063/1.4960690
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 6