A Memristor SPICE Model Accounting for Volatile Characteristics of Practical ReRAM (2014)
Attributed to:
Reliably unreliable nanotechnologies
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/led.2013.2291158
Publication URI: http://dx.doi.org/10.1109/led.2013.2291158
Type: Journal Article/Review
Parent Publication: IEEE Electron Device Letters
Issue: 1