A novel defect depth measurement method based on Nonlinear System Identification for pulsed thermographic inspection (2017)

First Author: Zhao Y

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ymssp.2016.08.033

Publication URI: http://dx.doi.org/10.1016/j.ymssp.2016.08.033

Type: Journal Article/Review

Parent Publication: Mechanical Systems and Signal Processing