Multispectral optical imaging combined in situ with XPS or ToFSIMS and principal component analysis In situ multispectral optical imaging for surface analysis (2016)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/sia.6046
Publication URI: http://dx.doi.org/10.1002/sia.6046
Type: Journal Article/Review
Parent Publication: Surface and Interface Analysis
Issue: 13
ISSN: 0142-2421