A well conditioned EFIE for capacitance extraction (2016)
Attributed to:
Boundary Element Methods for Next-Gen Devices in TeraHertz Technology
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/aps.2016.7696491
Publication URI: http://dx.doi.org/10.1109/aps.2016.7696491
Type: Conference/Paper/Proceeding/Abstract