Structural and Electrical Characterization of SiO2 Gate Dielectrics Deposited from Solutions at Moderate Temperatures in Air. (2017)
Attributed to:
Materials World Network-- Ultrafast Switching of Phase Change Materials: Combined Nanosecond and Nanometer Exploration
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acsami.6b11214
PubMed Identifier: 27933760
Publication URI: http://europepmc.org/abstract/MED/27933760
Type: Journal Article/Review
Volume: 9
Parent Publication: ACS applied materials & interfaces
Issue: 1
ISSN: 1944-8244