Machine vision metrology, Error analysis, Speed estimation, Monocular stereoscopy, Statistical calibration. (2016)
Attributed to:
Designing Nanosystems: the CMOS Way
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Publication URI: http://www.sensorsportal.com/HTML/DIGEST/P_2802.htm
Type: Journal Article/Review
Volume: 197
Parent Publication: Sensors and Transducers
Issue: 2