Real-Time Temperature Estimation for Power MOSFETs Considering Thermal Aging Effects (2014)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tdmr.2013.2292547
Publication URI: http://dx.doi.org/10.1109/tdmr.2013.2292547
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Device and Materials Reliability
Issue: 1