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Real-Time Temperature Estimation for Power MOSFETs Considering Thermal Aging Effects (2014)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tdmr.2013.2292547

Publication URI: http://dx.doi.org/10.1109/tdmr.2013.2292547

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Device and Materials Reliability

Issue: 1