The impact of triangular defects on electrical characteristics and switching performance of 3.3kV 4H-SiC PiN diode (2016)
Attributed to:
Underpinning Power Electronics 2012: Devices Theme
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ecce.2016.7855502
Publication URI: http://dx.doi.org/10.1109/ecce.2016.7855502
Type: Conference/Paper/Proceeding/Abstract