The impact of triangular defects on electrical characteristics and switching performance of 3.3kV 4H-SiC PiN diode (2016)

First Author: Bonyadi Y

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ECCE.2016.7855502

Publication URI: http://dx.doi.org/10.1109/ECCE.2016.7855502

Type: Conference/Paper/Proceeding/Abstract