Measurement of thin film interfacial surface roughness by coherence scanning interferometry (2017)
Attributed to:
SUPERSOLAR Solar Energy Hub
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.4978066
Publication URI: http://dx.doi.org/10.1063/1.4978066
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 10
ISSN: 0021-8979