Measurement of thin film interfacial surface roughness by coherence scanning interferometry (2017)

First Author: Yoshino H

Attributed to: SUPERSOLAR Solar Energy Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4978066

Publication URI: http://dx.doi.org/10.1063/1.4978066

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 10

ISSN: 0021-8979