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Sample rotation improves gas cluster sputter depth profiling of polymers (2017)

First Author: Smith E

Attributed to: University of Nottingham - Equipment Account funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/sia.6250

Publication URI: http://dx.doi.org/10.1002/sia.6250

Type: Journal Article/Review

Parent Publication: Surface and Interface Analysis

Issue: 10