Sample rotation improves gas cluster sputter depth profiling of polymers (2017)
Attributed to:
University of Nottingham - Equipment Account
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/sia.6250
Publication URI: http://dx.doi.org/10.1002/sia.6250
Type: Journal Article/Review
Parent Publication: Surface and Interface Analysis
Issue: 10