Volatility Characterization for RRAM Devices (2017)

First Author: Gupta I

Attributed to: Reliably unreliable nanotechnologies funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/led.2016.2631631

Publication URI: http://dx.doi.org/10.1109/led.2016.2631631

Type: Journal Article/Review

Parent Publication: IEEE Electron Device Letters

Issue: 1