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Probing the Critical Region of Conductive Filament in Nanoscale HfO 2 Resistive-Switching Device by Random Telegraph Signals (2017)

First Author: Chai Z

Attributed to: Mechanisms and Control of Resistive Switching in Dielectrics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2017.2742578

Publication URI: http://dx.doi.org/10.1109/ted.2017.2742578

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 10