📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

The Origin of the High Off-State Current in p-Type Cu 2 O Thin Film Transistors (2017)

First Author: Han S

Attributed to: The Physics and Engineering of Oxide Semiconductors for Large-Area CMOS funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/led.2017.2748064

Publication URI: http://dx.doi.org/10.1109/led.2017.2748064

Type: Journal Article/Review

Parent Publication: IEEE Electron Device Letters

Issue: 10