The Origin of the High Off-State Current in p-Type Cu 2 O Thin Film Transistors (2017)

First Author: Han S
Attributed to:  The Physics and Engineering of Oxide Semiconductors for Large-Area CMOS funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/led.2017.2748064

Publication URI: http://dx.doi.org/10.1109/led.2017.2748064

Type: Journal Article/Review

Parent Publication: IEEE Electron Device Letters

Issue: 10