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Comparison of cross-sectional transmission electron microscope studies of thin germanium epilayers grown on differently oriented silicon wafers. (2017)

First Author: Norris DJ

Attributed to: Renaissance Germanium funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1111/jmi.12654

PubMed Identifier: 28972660

Publication URI: http://europepmc.org/abstract/MED/28972660

Type: Journal Article/Review

Volume: 268

Parent Publication: Journal of microscopy

Issue: 3

ISSN: 0022-2720