Comparative study of image contrast in scanning electron microscope and helium ion microscope. (2017)
Attributed to:
SEE MORE: SECONDARY ELECTRON EMISSION - MICROSCOPY FOR ORGANICS WITH RELIABLE ENGINEERING-PROPERTIES
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1111/jmi.12660
PubMed Identifier: 29154504
Publication URI: http://europepmc.org/abstract/MED/29154504
Type: Journal Article/Review
Volume: 268
Parent Publication: Journal of microscopy
Issue: 3
ISSN: 0022-2720