Experimental evaluation of interfaces using atomic-resolution high angle annular dark field (HAADF) imaging. (2012)

First Author: Robb PD

Attributed to: III-V MOSFETs for Ultimate CMOS funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2011.10.015

PubMed Identifier: 22343667

Publication URI: http://europepmc.org/abstract/MED/22343667

Type: Journal Article/Review

Volume: 114

Parent Publication: Ultramicroscopy

ISSN: 0304-3991