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Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopy. (2012)

First Author: Robb PD

Attributed to: III-V MOSFETs for Ultimate CMOS funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.micron.2012.04.018

PubMed Identifier: 22633853

Publication URI: http://europepmc.org/abstract/MED/22633853

Type: Journal Article/Review

Volume: 43

Parent Publication: Micron (Oxford, England : 1993)

Issue: 10

ISSN: 0968-4328