Light-activated resistance switching in SiOx RRAM devices (2017)
Attributed to:
Structural dynamics of amorphous functional oxides - the role of morphology and electrical stress
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.5009069
Publication URI: http://dx.doi.org/10.1063/1.5009069
Type: Journal Article/Review
Parent Publication: Applied Physics Letters
Issue: 23