An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements (2017)

First Author: Votsi H

Attributed to: University of Surrey- Equipment Account funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/lmwc.2017.2750086

Publication URI: http://dx.doi.org/10.1109/lmwc.2017.2750086

Type: Journal Article/Review

Parent Publication: IEEE Microwave and Wireless Components Letters

Issue: 11