Hydrogen and the Light-Induced Bias Instability Mechanism in Amorphous Oxide Semiconductors. (2017)

First Author: Li H

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1038/s41598-017-17290-5

PubMed Identifier: 29203820

Publication URI: http://europepmc.org/abstract/MED/29203820

Type: Journal Article/Review

Volume: 7

Parent Publication: Scientific reports

Issue: 1

ISSN: 2045-2322