Novel approach based on continuous trench modelling to predict focused ion beam prepared freeform surfaces (2018)

First Author: Bilbao-Guillerna A

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.jmatprotec.2017.10.024

Publication URI: http://dx.doi.org/10.1016/j.jmatprotec.2017.10.024

Type: Journal Article/Review

Parent Publication: Journal of Materials Processing Technology

ISSN: 0924-0136