Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution. (2017)
Attributed to:
Fast Pixel Detectors: a paradigm shift in STEM imaging
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2017.02.006
PubMed Identifier: 28434783
Publication URI: http://europepmc.org/abstract/MED/28434783
Type: Journal Article/Review
Volume: 180
Parent Publication: Ultramicroscopy
ISSN: 0304-3991