Interaction between hot carrier aging and PBTI degradation in nMOSFETs: Characterization, modelling and lifetime prediction (2017)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/IRPS.2017.7936419

Publication URI: http://dx.doi.org/10.1109/IRPS.2017.7936419

Type: Conference/Paper/Proceeding/Abstract