Interaction between hot carrier aging and PBTI degradation in nMOSFETs: Characterization, modelling and lifetime prediction (2017)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/irps.2017.7936419
Publication URI: http://dx.doi.org/10.1109/irps.2017.7936419
Type: Conference/Paper/Proceeding/Abstract