📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! Tell us what works, what doesn't, and how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community. Please send your feedback to gateway@ukri.org by 11 August 2025.

Interfacial sharpness and intermixing in a Ge-SiGe multiple quantum well structure (2018)

First Author: Bashir A

Attributed to: Engineering Quantum Technology Systems on a Silicon Platform funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.5001158

Publication URI: http://dx.doi.org/10.1063/1.5001158

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 3