Interfacial sharpness and intermixing in a Ge-SiGe multiple quantum well structure (2018)
Attributed to:
Engineering Quantum Technology Systems on a Silicon Platform
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.5001158
Publication URI: http://dx.doi.org/10.1063/1.5001158
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 3