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A synchrotron X-ray diffraction deconvolution method for the measurement of residual stress in thermal barrier coatings as a function of depth (2016)

First Author: Li C

Attributed to: Next Generation Multi-Dimensional X-Ray Imaging funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1107/s1600576716013935

PubMed Identifier: 27980507

Publication URI: http://europepmc.org/abstract/MED/27980507

Type: Journal Article/Review

Parent Publication: Journal of Applied Crystallography

Issue: 6

ISSN: 0021-8898