Ductile dicing of LiNbO 3 ridge waveguide facets to achieve 0.29 nm surface roughness in single process step (2017)
Attributed to:
UK Quantum Technology Hub for Sensors and Metrology
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1049/el.2017.2863
Publication URI: http://dx.doi.org/10.1049/el.2017.2863
Type: Journal Article/Review
Parent Publication: Electronics Letters
Issue: 25