Investigation of Preexisting and Generated Defects in Nonfilamentary a-Si/TiO 2 RRAM and Their Impacts on RTN Amplitude Distribution (2018)

First Author: Ma J
Attributed to:  Mechanisms and Control of Resistive Switching in Dielectrics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2018.2792221

Publication URI: http://dx.doi.org/10.1109/ted.2018.2792221

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 3