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Super-Resolution Defect Characterization Using Microwave Near-Field Resonance Reflectometry and Cross-correlation Image Processing (2017)

First Author: Malyuskin O

Attributed to: Pervasive Integrated Millimeter Wave Systems Technology funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/s11220-017-0157-8

Publication URI: http://dx.doi.org/10.1007/s11220-017-0157-8

Type: Journal Article/Review

Parent Publication: Sensing and Imaging

Issue: 1