Exploiting Aging Benefits for the Design of Reliable Drowsy Cache Memories (2018)
Attributed to:
Resilient and Testable Energy-Efficient Digital Hardware
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tcad.2017.2729399
Publication URI: http://dx.doi.org/10.1109/tcad.2017.2729399
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Issue: 7