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Exploiting Aging Benefits for the Design of Reliable Drowsy Cache Memories (2018)

First Author: Rossi D

Attributed to: Resilient and Testable Energy-Efficient Digital Hardware funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tcad.2017.2729399

Publication URI: http://dx.doi.org/10.1109/tcad.2017.2729399

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Issue: 7