Accelerated Surface Measurement Using Wavelength Scanning Interferometer with Compensation of Environmental Noise (2013)

First Author: Muhamedsalih H
Attributed to:  On-line surface inspection of roll-to-roll film processing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.procir.2013.08.014

Publication URI: http://dx.doi.org/10.1016/j.procir.2013.08.014

Type: Journal Article/Review

Parent Publication: Procedia CIRP