High fluence effects on silicon detectors: damage and defects characterization: An overview of the state of the art of radiation resistance detectors (2017)

Abstract

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Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.22323/1.287.0032

Publication URI: http://dx.doi.org/10.22323/1.287.0032

Type: Conference/Paper/Proceeding/Abstract