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Comparing signal intensity and refraction sensitivity of double and single mask edge illumination lab-based x-ray phase contrast imaging set-ups (2017)

First Author: Kallon G

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6463/aa8692

Publication URI: http://dx.doi.org/10.1088/1361-6463/aa8692

Type: Journal Article/Review

Parent Publication: Journal of Physics D: Applied Physics

Issue: 41