Combined Atomic Force Microscopy and Photoluminescence Imaging to Increase the Yield of Quantum Dot Photonic Devices (2017)
Attributed to:
An Atomic Force Microscopy study of buried InAs/GaAs quantum-dot single-photon sources
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1364/fio.2017.fm2e.1
Publication URI: https://doi.org/10.1364/FIO.2017.FM2E.1
Type: Conference/Paper/Proceeding/Abstract