Diffusion Barrier Effect of Ni-W-P and Ni-Fe UBMs during High Temperature Storage (2017)

First Author: Gao L

Attributed to: Underpinning Power Electronics 2012: Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ectc.2017.51

Publication URI: http://dx.doi.org/10.1109/ectc.2017.51

Type: Conference/Paper/Proceeding/Abstract

ISSN: 05695503